Corelis Adds Boundary-Scan Test Capability To The Blackhawk XDS560-Class JTAG Emulator

Dallas, TX – Corelis Inc., a leading supplier of high-performance boundary-scan (JTAG) test tools named ScanExpress, announced recently boundary-scan interconnect test support for Blackhawk XDS560-class JTAG emulators. This added capability allows Blackhawk emulator users to integrate JTAG debug and testing into their existing design, development, and production environments.

Corelis already provides the widest option of high-performance boundary-scan controllers on PCI, PCIe, PXI, USB 2.0 and Ethernet platforms supporting test clock speeds up to 100 MHz. Now Blackhawk emulator controllers can work directly with ScanExpress software products, including the new ScanExpress Debugger™, an excellent, low-cost tool for engineers doing hardware debug during prototype design, verification, and testing. ScanExpress Debugger™ is very useful for finding shorts and opens on and between BGA devices and any fine-pitch component.

"The integration of Corelis Boundary Scan tools with the Blackhawk emulator line provides important new capability to assist TI DSP developers in designing, powering up, and testing new board designs," said Stephen Lau, TI Emulation Technology Product Manager.

"Blackhawk emulators have become synonymous with TI DSP development. Corelis recognized the opportunity to provide a boundary-scan debug and test solution to Blackhawk customers, while still allowing them to use their existing test hardware," said Karla May, Corelis Boundary-Scan Product Manager. "In addition to lowering costs, adding boundary-scan test support to an already familiar controller allows engineers to integrate their designs much more quickly."

SOURCE: Corelis